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Patent Searching and Data


Title:
MEASUREMENT APPARATUS, PROGRAM, AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2013/105485
Kind Code:
A1
Abstract:
There is provided a measurement apparatus including an objective lens, a stage, a setting unit, and a controller. The stage is configured to support a sample vessel in which a plurality of wells each containing a sample are arranged and to define relative positions of the sample vessel and the objective lens. The setting unit is configured to determine whether to set each of the plurality of wells to be a measurement target and set the measurement target. The controller is configured to control the stage such that a well determined to be the measurement target by the setting unit and the objective lens face each other.

Inventors:
TANAKA EIICHI (JP)
TAMAI MASANOBU (JP)
MORIKAWA HIROAKI (JP)
TATSUTA HIROKAZU (JP)
DOWAKI SUGURU (JP)
HAYAKAWA TOMOHIRO (JP)
MATSUI ERIKO (JP)
HASEGAWA SHIN (JP)
MINAKAWA TATSUYA (JP)
Application Number:
PCT/JP2013/000019
Publication Date:
July 18, 2013
Filing Date:
January 08, 2013
Export Citation:
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Assignee:
SONY CORP (JP)
International Classes:
G01N35/00
Foreign References:
JPS62237342A1987-10-17
US20060275745A12006-12-07
US20060068377A12006-03-30
US20040102742A12004-05-27
JP2008289799A2008-12-04
JP2010130966A2010-06-17
Attorney, Agent or Firm:
OMORI, Junichi (7-5-47 Akasaka Minato-k, Tokyo 52, JP)
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Claims: