Title:
MEASUREMENT APPARATUS
Document Type and Number:
WIPO Patent Application WO/2023/153368
Kind Code:
A1
Abstract:
A measurement apparatus (1) comprises: a light emission unit (10) that applies measurement light toward a measurement area; a first light reception unit (20) that receives reflected light from the measurement area; a control unit (40) that controls the light emission unit (10) and the first light reception unit (20) and calculates the distance to an object (50) in the measurement area on the basis of the light receiving result of the first light reception unit (20); and a second light reception unit (30) that receives light which is part of light, from the measurement area, having a wavelength different from that of the measurement light.
Inventors:
ITO YOSHIRO (JP)
HAYASHI YUKIO (JP)
SONE HIDEMICHI (JP)
MOTOHASHI KAZUYA (JP)
HARUSE YUTA (JP)
HAYASHI YUKIO (JP)
SONE HIDEMICHI (JP)
MOTOHASHI KAZUYA (JP)
HARUSE YUTA (JP)
Application Number:
PCT/JP2023/003812
Publication Date:
August 17, 2023
Filing Date:
February 06, 2023
Export Citation:
Assignee:
KOITO MFG CO LTD (JP)
International Classes:
G01S7/486; G01C3/06; G01S7/484; G01S17/931
Foreign References:
| US20200341146A1 | 2020-10-29 | |||
| JP2021152536A | 2021-09-30 | |||
| US20120287276A1 | 2012-11-15 | |||
| JP2021152469A | 2021-09-30 |
Attorney, Agent or Firm:
SHIN-EI, P.C. (JP)
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