Title:
MEASUREMENT DATA CORRECTION METHOD FOR THREE-DIMENSIONAL LASER-LIGHT-SCANNING DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/054094
Kind Code:
A1
Abstract:
The present invention addresses the problem of providing a measurement data correction method for a three-dimensional laser-light-scanning device that makes it possible to enhance measurement accuracy through simple calibration of the three-dimensional laser-light-scanning device by a user. To address this problem, in the present invention: point cloud data, which is obtained in the time it takes for a full rotation at the slower from among the horizontal rotation speed and vertical rotation speed of a reflection mirror (2) of a laser measurement unit (1) in the direction in which laser light is reflected by the reflection mirror, is divided into a pair of layers consisting of point cloud data A and point cloud data B; a prescribed mechanical error parameter is selected; the selected mechanical error parameter is applied to point cloud data A and point cloud data B; marker coordinate values are obtained from point cloud data A and point cloud data B and compared; and a mechanical error parameter correction value resulting in a coordinate value difference less than or equal to a prescribed threshold is calculated.
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Inventors:
SHINOZUKA YUKIO (JP)
Application Number:
PCT/JP2019/005776
Publication Date:
March 19, 2020
Filing Date:
February 18, 2019
Export Citation:
Assignee:
KUMONOS CORP (JP)
International Classes:
G01C15/00; G02B26/10; G01C3/00; G01C3/06
Domestic Patent References:
| WO2013128265A2 | 2013-09-06 |
Foreign References:
| JP2018054408A | 2018-04-05 | |||
| JP2017198555A | 2017-11-02 | |||
| JPH07146121A | 1995-06-06 | |||
| JP2008082782A | 2008-04-10 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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