Title:
MEASUREMENT DATA MANAGEMENT SYSTEM, MEASUREMENT DATA MANAGEMENT METHOD, AND OPTICAL CHARACTERISTIC MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/056161
Kind Code:
A1
Abstract:
This measurement data management system is provided with: a first storage processing unit for storing, in a first storage unit, diagnosis information obtained through checking the state of an optical characteristic measurement device; a second storage processing unit for storing, in a second storage unit and in association with the diagnosis information, measurement data obtained through the measurement of prescribed optical characteristics of an object of measurement using the optical characteristic measurement device; and an output unit for, when outputting the measurement data stored in the second storage unit, outputting the diagnosis information stored in the first storage unit that has been associated with the measurement data.
Inventors:
MATSUMOTO TAKUYA (JP)
Application Number:
PCT/JP2017/033230
Publication Date:
March 29, 2018
Filing Date:
September 14, 2017
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01J3/46; G01J3/02; G01N35/00
Domestic Patent References:
| WO2014041866A1 | 2014-03-20 |
Foreign References:
| JP2002228557A | 2002-08-14 | |||
| JP2006338552A | 2006-12-14 | |||
| JP2000275253A | 2000-10-06 | |||
| US20120203510A1 | 2012-08-09 | |||
| JP2014525587A | 2014-09-29 |
Attorney, Agent or Firm:
KOTANI, Etsuji et al. (JP)
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