MEASUREMENT DEVICE, MEASUREMENT APPARATUS, AND METHOD

WIPO Patent Application WO/2014/167828

A1

[Problem] To carry out mass spectrometry and an optical measurement such as SERS using the same sample, and thereby obtain both information concerning the total amount of matter in the sample and information concerning the vicinity of the surface of the sample. [Solution] A metallic film of this measurement device (10), which is provided with a transparent dielectric substrate, is irradiated with first light (L1) from the transparent dielectric substrate side, a photoelectric field is generated that is enhanced by the photoelectric enhancement effect of localized plasmons induced on the surface of the metallic film by the irradiation, light (L2) emitted from the transparent dielectric substrate side is detected, and, when a voltage has been applied to a metallic microrelief structure layer (14) via a voltage applying electrode (15), second light (L3) is irradiated onto a sample (S) and a matrix agent (M), which are disposed on the surface of the metallic microrelief structure layer (14), from the opposite side to the side from which the first light (L1) is irradiated, which causes the mass spectrometry analytes in the sample to be desorbed from the surface, and the desorbed analytes are detected.

NAYA MASAYUKI (JP)
YAMAZOE SHOGO (JP)
SHIOTA MEGUMI (JP)
SUEMATSU MAKOTO (JP)

PCT/JP2014/001985

October 16, 2014

April 07, 2014

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FUJIFILM CORP (JP)

G01N21/65; G01N27/62

WO2014050133A1

2014-04-03

JP2012063294A	2012-03-29
JP2007171003A	2007-07-05
JP2008304370A	2008-12-18
JP2011232180A	2011-11-17
JP2012181022A	2012-09-20
JP3930563B2	2007-06-13
JP2011246307A	2011-12-08
US20090238723A1	2009-09-24

YANAGIDA, Masashi et al. (JP)
Seiji Yanagida (JP)

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