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Patent Searching and Data


Title:
MEASUREMENT DEVICE AND MATERIAL TESTER
Document Type and Number:
WIPO Patent Application WO/2017/158753
Kind Code:
A1
Abstract:
In an FPGA 60, waveform data to be sent from the FPGA 60 to a DAC 51 is stored, and a logical circuit is configured from a detection circuit 61 for extracting test force value and elongation value signal components from a signal input from an ADC 58, an offset subtractor 68, and a gain multiplier 69. The detection circuit 61 extracts a resistance component proportional to the test force and displacement. In the detection circuit 61, an expression that includes a harmonic component of an odd multiple of the carrier frequency is used as a correlation function for extracting the resistance component. As a result, it is possible to obtain calculation results at a sampling frequency that is higher than the carrier frequency.

Inventors:
TSUJI HIROSHI (JP)
Application Number:
JP2016/058264
Publication Date:
September 21, 2017
Filing Date:
March 16, 2016
Export Citation:
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Assignee:
SHIMADZU CORP (?6048511, JP)
International Classes:
G01N3/06; G01D5/22
Foreign References:
JPH06273191A1994-09-30
JPH09222336A1997-08-26
US5774366A1998-06-30
Other References:
See also references of EP 3431958A4
Attorney, Agent or Firm:
OTSUBO TAKASHI (?6128063, JP)
Takashi Otsubo (?6128063, JP)
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