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Title:
MEASUREMENT DEVICE AND METHOD FOR IN-SITU TIME-RESOLVED X-RAY ABSORPTION SPECTRUM
Document Type and Number:
WIPO Patent Application WO/2018/201586
Kind Code:
A1
Abstract:
A measurement device and method for an in-situ time-resolved X-ray absorption spectrum. The measurement device mainly comprises an X-ray source (1), a first slit (2), an acousto-optic X-ray filter (9), a radio frequency transmitter (10), a second slit (4), a front ionization chamber (5), a front ionization chamber signal amplifier (11), a sample to be tested (6), a rear ionization chamber (7), a rear ionization chamber signal amplifier (13), a data collector (12), and a computer (14). The X-ray source (1), the acousto-optic X-ray filter (9), and the radio frequency transmitter (10) produce a monochromatic X-ray beam. The front ionization chamber (5) measures the intensity of the X-ray beam before the X-ray beam passes through the sample (6). The rear ionization chamber (7) measures the intensity of the X-ray beam after the X-ray beam passes through the sample (6). The front ionization chamber signal amplifier (11), the rear ionization chamber signal amplifier (13), the data collector (12), and the computer (14) acquire and process data. Mechanical components do not move during device measurement, the device can realize time-resolved measurement of an X-ray absorption spectrum and has high measurement accuracy.

Inventors:
SHAO JIANDA (CN)
LIU SHIJIE (CN)
WANG SHENGHAO (CN)
Application Number:
CN2017/089248
Publication Date:
November 08, 2018
Filing Date:
June 20, 2017
Export Citation:
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Assignee:
SHANGHAI INST OPTICS & FINE MECH CAS (CN)
International Classes:
G01N23/083
Foreign References:
CN1749741A2006-03-22
CN1587929A2005-03-02
CN103076352A2013-05-01
CN101285764A2008-10-15
CN101124475A2008-02-13
CN106574867A2017-04-19
CN103370651A2013-10-23
CN202486075U2012-10-10
JP2010032341A2010-02-12
JPS5776441A1982-05-13
JP2013190226A2013-09-26
Other References:
XU, SHUNSHENG: "Current Status and Prospects of X-Ray Analysis", PHYSICS, 30 June 1983 (1983-06-30)
Attorney, Agent or Firm:
SHANGHAI HENGHUI INTELLECTUAL PROPERTY AGENCY (CN)
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