Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
MEASUREMENT DEVICE AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2012/053114
Kind Code:
A1
Abstract:
A measurement device and a measurement means that can specify the direction of a force corresponding to a crank angle are provided. A measurement module (301) for force applied to a bicycle (1) has: a distortion sensor (366) that detects distortion in a crank (105) of the bicycle (1) transmitting the force of a user by the crank (105) and one front gear (109) selected from one or more front gears (109); a measurement module magnetic sensor (311) that detects the passage through a prescribed position of the crank (105); and a measurement module control unit (351). The measurement module control unit (351) calculates the distribution of force applied by the user by calculating the rotation angle of the crank (105) based on the amount of time that has passed since the time that the crank (105) passed the prescribed position as detected by the measurement module magnetic sensor (311), calculating the amount of force applied to the crank from the amount of distortion to the crank as detected by the distortion sensor (366), and calculating the correspondence between the rotation angle and the force applied to the crank (105).

Inventors:
KODAMA YASUTERU (JP)
FUJITA RYUJIRO (JP)
SHIODA TAKEHIKO (JP)
KAMETANI RYUSHIN (JP)
Application Number:
PCT/JP2010/068763
Publication Date:
April 26, 2012
Filing Date:
October 22, 2010
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
PIONEER CORP (JP)
KODAMA YASUTERU (JP)
FUJITA RYUJIRO (JP)
SHIODA TAKEHIKO (JP)
KAMETANI RYUSHIN (JP)
International Classes:
B62J99/00; A63B69/16; B62M3/00; G01B7/30; G01L1/00; G01L3/14
Domestic Patent References:
WO2004113157A12004-12-29
Foreign References:
JPH0796877A1995-04-11
JPH10114293A1998-05-06
JPH06317601A1994-11-15
JP2000016367A2000-01-18
JPH09142369A1997-06-03
JPH10291493A1998-11-04
Attorney, Agent or Firm:
EBISU International Patent Office (JP)
Patent business corporation エビス international patent firm (JP)
Download PDF:
Claims: