MEASUREMENT DEVICE AND MEASUREMENT METHOD

Title:

MEASUREMENT DEVICE AND MEASUREMENT METHOD

Document Type and Number:

WIPO Patent Application WO/2016/006515

Kind Code:

A1

Abstract:

This measurement device (1) is provided with a first signal generation unit (3) and a first removal unit (5). The first signal generation unit (3) generates, on the basis of a first physical quantity (p1) and a second physical quantity (p2), a first source signal (x1(t)) including a fundamental wave and a plurality of higher harmonic waves. The first removal unit (5) removes some or all of the plurality of higher harmonic waves from the first source signal (x1(t)). The first source signal (x1(t)) is a periodic signal. One period of the first source signal (x1(t)) includes a first signal (p1), a second signal (p2), and a reference signal (pr). The first signal (p1) has a first time width (w1), and indicates the first physical quantity (p1). The second signal (p2) has a second time width (w2), and indicates the second physical quantity (p2). The reference signal (pr) has a third time width (w3), and indicates a reference physical quantity (pr).

Inventors:

KATSURA MAKOTO (JP)

Application Number:

PCT/JP2015/069026

Publication Date:

January 14, 2016

Filing Date:

July 01, 2015

Export Citation:

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Assignee:

UNIV OSAKA (JP)

International Classes:

G01R19/00; G01J3/02

Foreign References:

JP2005295542A	2005-10-20
JPH07146756A	1995-06-06

Other References: