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Patent Searching and Data


Title:
MEASUREMENT DEVICE AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2018/131470
Kind Code:
A1
Abstract:
The present invention is a measurement device characterized by: being provided with a numerical density measuring instrument 20 for measuring the numerical density of particles in a gaseous body, a humidity measuring instrument 24 for measuring the humidity of the gas, and a gas concentration measuring instrument 22 for measuring the concentration of a specific gas in the gaseous body; and the measurement device calculating the mass concentration of particles in the gaseous body on the basis of a correlation between: a measured numerical density, a measured humidity, and the measured concentration of the specific gas; a previously-obtained numerical density, humidity, and the concentration of the specific gas; and the mass concentration of the particles in the gaseous body. The present invention addresses the problem of reducing the size and cost of a measurement device.

Inventors:
TAKASU RYOZO (JP)
Application Number:
PCT/JP2017/046675
Publication Date:
July 19, 2018
Filing Date:
December 26, 2017
Export Citation:
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Assignee:
FUJITSU LTD (JP)
International Classes:
G01N15/06
Domestic Patent References:
WO2016067484A12016-05-06
Foreign References:
JP2016223907A2016-12-28
JP2015224962A2015-12-14
JP2000180348A2000-06-30
JPH11281757A1999-10-15
Attorney, Agent or Firm:
MUKOUYAMA Naoki (JP)
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