Title:
MEASUREMENT DEVICE AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2018/150446
Kind Code:
A1
Abstract:
The present invention makes it possible to satisfactorily measure electrical properties with a measurement device even if a component is small. In this measurement device, at least a portion of a component holding portion is established as an antistatic portion formed from an antistatic material. Since the sheet resistance of the antistatic portion is high, it is possible to measure the electrical properties of a component while the component is held by the antistatic portion. As a result, even if the component is small, it is possible satisfactorily measure the electrical properties of the component while preventing the component from being dispersed.
Inventors:
SAWADA TOSHIYUKI (JP)
Application Number:
PCT/JP2017/005250
Publication Date:
August 23, 2018
Filing Date:
February 14, 2017
Export Citation:
Assignee:
FUJI CORP (JP)
International Classes:
H05K13/08; G01R31/00
Domestic Patent References:
| WO2017009987A1 | 2017-01-19 |
Foreign References:
| JP2003337153A | 2003-11-28 | |||
| JP2007019296A | 2007-01-25 |
Attorney, Agent or Firm:
CHUBU PATENT OFFICE (JP)
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