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Patent Searching and Data


Title:
MEASUREMENT DEVICE AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2019/172183
Kind Code:
A1
Abstract:
A measurement device 1 comprises: an acquisition unit 19 for acquiring reference information associating the distance between an object and a position where reflected waves that are electromagnetic waves produced when predetermined electromagnetic waves transmitted toward the object are reflected at the object are received, a phase of the reflected waves, and a physical property of the object; a transmitting antenna 11 for transmitting electromagnetic waves toward a measurement subject 2; a receiving antenna 12 for receiving reflected waves from the measurement subject 2; and an identification unit 20 for identifying a physical property of the measurement subject 2 on the basis of the phase of the reflected waves received by the receiving antenna 12, by consulting the reference information that corresponds to an object corresponding to the material of the measurement subject 2 and that corresponds to the distance between the measurement subject 2 and the receiving antenna 12.

Inventors:
MIYATA YASUSHI (JP)
SHIMOTORI HIROTAKA (JP)
NEMOTO AKIYUKI (JP)
ISHIMARU CHISATO (JP)
Application Number:
JP2019/008385
Publication Date:
September 12, 2019
Filing Date:
March 04, 2019
Export Citation:
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Assignee:
CITY OF NAGOYA (JP)
NIHON DEMPA KOGYO CO (JP)
International Classes:
G01N22/00
Foreign References:
JP2011080877A2011-04-21
JP2015184215A2015-10-22
JP2007271412A2007-10-18
JPH06160306A1994-06-07
US5369369A1994-11-29
Attorney, Agent or Firm:
IZUMI Michihiro (JP)
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