Title:
MEASUREMENT DEVICE AND STANDARD RESISTOR
Document Type and Number:
WIPO Patent Application WO/2023/249094
Kind Code:
A1
Abstract:
The present invention makes it possible to easily know an error of measurement by this measurement device. A measurement device (100) is characterized by comprising: a data processing control circuit (4) that measures impedance between first internal terminals (hci, hpi) and second internal terminals (lci, lpi) on the basis of voltage and current between the first internal terminals (hci, hpi) and the second internal terminals (lci, lpi) upon application of the voltage or the current between the first internal terminals (hci, hpi) and the second internal terminals (lci, lpi); a reference circuit (8) that has a prescribed impedance; and a switch (5) that switches the connection destination of the first internal terminals (hci, hpi) between first external terminals (HC, HP) and one terminal of the reference circuit (8), and switches the connection destination of the second internal terminals (lci, lpi) between second external terminals (LC, LP) and the other terminal of the reference circuit (8).
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Inventors:
HANEDA KAZUAKI (JP)
KITAMURA NAOYA (JP)
KITAMURA NAOYA (JP)
Application Number:
PCT/JP2023/023200
Publication Date:
December 28, 2023
Filing Date:
June 22, 2023
Export Citation:
Assignee:
HIOKI ELECTRIC WORKS (JP)
International Classes:
G01R27/02; G01R35/00
Domestic Patent References:
| WO2017061036A1 | 2017-04-13 |
Foreign References:
| JP2019060767A | 2019-04-18 | |||
| JP2012173182A | 2012-09-10 | |||
| JP2008157911A | 2008-07-10 |
Attorney, Agent or Firm:
EINSEL Felix-Reinhard et al. (JP)
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