Title:
MEASUREMENT DEVICE, STORAGE DEVICE, MEASUREMENT SYSTEM, AND METHOD FOR MEASURING OFFSET ERROR
Document Type and Number:
WIPO Patent Application WO/2019/111878
Kind Code:
A1
Abstract:
A measurement device 50 of an electrochemical element 30 that is connected, via a first switch 40, to a terminal part 22P having a load connected thereto, wherein: the measurement device 50 is provided with a current limitation unit 75 provided to a bypass path BP of the first switch 40, a current sensor 60 for measuring the current of the electrochemical element 30, and a processing unit 100; when a voltage difference ΔV between the voltage of the electrochemical element 30 and the voltage of the terminal part 22P is equal to or greater than a prescribed value, the current limitation unit 75 permits the supply of power to the load through the bypass path BP, and when the voltage difference ΔV is less than the prescribed value, the current limitation unit 75 cuts off the current to the bypass path BP; and in a period of time after the first switch 40 has been turned off and until the voltage difference ΔV reaches the prescribed value due to a change in voltage of the terminal part 22P because of discharging of a charge/discharge element 170 connected in parallel to the load, the processing unit 100 performs a measurement process to measure the offset error ε of the current sensor 60.
Inventors:
IMANAKA YUKI (JP)
TAKAI SEIJI (JP)
IMURA MASAYUKI (JP)
TAKAI SEIJI (JP)
IMURA MASAYUKI (JP)
Application Number:
PCT/JP2018/044505
Publication Date:
June 13, 2019
Filing Date:
December 04, 2018
Export Citation:
Assignee:
GS YUASA INT LTD (JP)
International Classes:
G01R19/00; G01R35/00; H01M10/44; H01M10/48; H02J7/00
Foreign References:
| JP2010019805A | 2010-01-28 | |||
| JP2013209017A | 2013-10-10 | |||
| JP2007192723A | 2007-08-02 |
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