Title:
MEASUREMENT DEVICE, MEASUREMENT SYSTEM, MEASUREMENT PROGRAM, AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2020/022473
Kind Code:
A1
Abstract:
[Problem] To provide a measurement device, a measurement system, a measurement program, and a measurement method with which it is possible to quickly and accurately measure reflection characteristics of a desired subject by using a small sampling number. [Solution] According to one aspect of the present invention, there is provided a device for measuring reflection characteristics, wherein: the measurement device is provided with a control unit; the control unit is configured so as to measure reflection characteristics of a subject on the basis of subject information and teaching information; the subject information includes a coordinate position relationship between a light source position of incident light, a light detection position of reflected light, and a measurement location on the subject, and also includes numerical values pertaining to the incident light and the reflected light; the incident light is light with which the measurement location is irradiated; the reflected light is light that was reflected by the measurement location after the measurement location was irradiated with the incident light; the teaching information pertains to a known measurement result of the reflection characteristics; and the combined number of coordinate position relationships included in the subject information is 1-15.
Inventors:
WATANABE YOSHIHIRO (JP)
ISHIKAWA MASATOSHI (JP)
KACHI KONOSUKE (JP)
ISHIKAWA MASATOSHI (JP)
KACHI KONOSUKE (JP)
Application Number:
PCT/JP2019/029375
Publication Date:
January 30, 2020
Filing Date:
July 26, 2019
Export Citation:
Assignee:
UNIV TOKYO (JP)
International Classes:
G01N21/47
Domestic Patent References:
| WO2014189059A1 | 2014-11-27 | |||
| WO2015133287A1 | 2015-09-11 |
Foreign References:
| JP2016091359A | 2016-05-23 | |||
| JPH0777416A | 1995-03-20 | |||
| JP2016038222A | 2016-03-22 | |||
| JPH07150081A | 1995-06-13 | |||
| JP2007232652A | 2007-09-13 | |||
| US20150219557A1 | 2015-08-06 | |||
| JPH0472551A | 1992-03-06 |
Other References:
REO MIYASHITA, YOSHIHIRO WATANABE, MASATOSHI ISHIKAWA: "Fast reflection measuring measurement during shifting operation for digital archiving of books", VIEW2012 VISION ENGINEERING WORKSHOP 2012, 6 December 2012 (2012-12-06), pages 218 - 219, XP009525525
MASASHI NITTA; YOSHIHIRO WATANABE; MASATOSHI ISHIKAWA: "Adaptive BRDF Sampling Method Based on Between-model Variance", IEICE TECHNICAL REPORT, vol. 117, no. 391 (PRMU2017-139), 11 January 2018 (2018-01-11), pages 251 - 256, XP009525479, ISSN: 2432-6380
YOSHIHIRO WATANABE; KENJIRO SAITO; LEO MIYASHITA; MASATOSHI ISHIKAWA: "Minimal Sampling Design using Bayesian Optimization Toward High-speed BRDF Acquisition", IEICE TECHNICAL REPORT, vol. 117, no. 391 (PRMU2017-138), 11 January 2018 (2018-01-11), pages 245 - 250, XP009525478, ISSN: 2432-6380
"SVBRDF Acquisition Using Non-negative Matrix Factorization", IEICE TECHNICAL REPORT, vol. 117, no. 391, 11 January 2018 (2018-01-11), ISSN: 3432-6380
See also references of EP 3812743A4
MASASHI NITTA; YOSHIHIRO WATANABE; MASATOSHI ISHIKAWA: "Adaptive BRDF Sampling Method Based on Between-model Variance", IEICE TECHNICAL REPORT, vol. 117, no. 391 (PRMU2017-139), 11 January 2018 (2018-01-11), pages 251 - 256, XP009525479, ISSN: 2432-6380
YOSHIHIRO WATANABE; KENJIRO SAITO; LEO MIYASHITA; MASATOSHI ISHIKAWA: "Minimal Sampling Design using Bayesian Optimization Toward High-speed BRDF Acquisition", IEICE TECHNICAL REPORT, vol. 117, no. 391 (PRMU2017-138), 11 January 2018 (2018-01-11), pages 245 - 250, XP009525478, ISSN: 2432-6380
"SVBRDF Acquisition Using Non-negative Matrix Factorization", IEICE TECHNICAL REPORT, vol. 117, no. 391, 11 January 2018 (2018-01-11), ISSN: 3432-6380
See also references of EP 3812743A4
Attorney, Agent or Firm:
IPX PATENT PARTNERS (JP)
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