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Title:
MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/173290
Kind Code:
A1
Abstract:
A measurement device is characterized by satisfying relational formulae (1) and (2). Relational formula (1): 2YH/(X + Y) ≤ D < H Relational formula (2): Y ≤ A < X In these relational formulae, D is the distance between a light incidence port of a light-passage hole and a light-receiving surface of a light-receiving element. H is the distance between the light-receiving surface of the light-receiving element and a measurement point. X is the width in a range where the intensity of a laser light is equal to or greater than a prescribed intensity, the laser light being obtained by superposing a first laser light and a second laser light advancing toward the measurement point. Y is the width of the light-receiving surface of the light-receiving element. A is the width of the light incidence port of the light-passage hole.

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Inventors:
FUJIMOTO NAOYA (JP)
GOMEI TOMOO (JP)
KUNII KEISUKE (JP)
SAWADA RENSHI (JP)
NOGAMI HIROFUMI (JP)
MORITA NOBUTOMO (JP)
NAKASHIMA FUMIYA (JP)
Application Number:
PCT/JP2017/012164
Publication Date:
September 27, 2018
Filing Date:
March 24, 2017
Export Citation:
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Assignee:
AICHI TOKEI DENKI KK (JP)
UNIV KYUSHU NAT UNIV CORP (JP)
International Classes:
G01P5/26; G01P3/36
Foreign References:
JP2006029951A2006-02-02
US20040036873A12004-02-26
JPH0566226A1993-03-19
US4997272A1991-03-05
JPS5497468A1979-08-01
Attorney, Agent or Firm:
KAI-U PATENT LAW FIRM (JP)
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