MEASUREMENT METHOD AND MEASUREMENT DEVICE FOR ENERGY OF ELECTRONS EXCITED BY SUNLIGHT

Title:

MEASUREMENT METHOD AND MEASUREMENT DEVICE FOR ENERGY OF ELECTRONS EXCITED BY SUNLIGHT

Document Type and Number:

WIPO Patent Application WO/2014/104022

Kind Code:

A1

Abstract:

[Problem] To provide a technique capable of measuring the energy of electrons excited by exposing a semiconductor material to sunlight. [Solution] A surface layer having a negative electron affinity is formed on the surface of a semiconductor material (92b). The semiconductor material is placed in a vacuum environment and exposed to sunlight (97), photoelectrons emitted from the surface layer having the negative electron affinity are guided to a photoelectron spectroscope (99), and the energy of electrons excited by the sunlight (97) is measured. Since the surface layer having the negative electron affinity is used, the photoelectrons are obtained from the electrons excited by the sunlight, and thereby energy measurement becomes possible.

Inventors:

UJIHARA TORU (JP)
ICHIHASHI SHIRO (JP)
SHIMURA DAIKI (JP)
KUWAHARA MAKOTO (JP)
HARADA SHUNTA (JP)

Application Number:

PCT/JP2013/084497

Publication Date:

July 03, 2014

Filing Date:

December 24, 2013

Export Citation:

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Assignee:

UNIV NAGOYA NAT UNIV CORP (JP)

International Classes:

H01L21/66; H01L31/04

Foreign References:

JPH10188781A	1998-07-21
JPH02144844A	1990-06-04
JP2008078369A	2008-04-03

Other References: