MEASUREMENT METHOD - KONICA MINOLTA INC

Title:

MEASUREMENT METHOD

Document Type and Number:

WIPO Patent Application WO/2018/051863

Kind Code:

A1

Abstract:

In the present invention, a measurement chip having a prism, a metal film, and a capture body is prepared. In a state in which a sample is present on the metal film, when a first light is radiated to the metal film at a first incidence angle less than a critical angle from the prism side, the first light transmitted through the metal film and the sample is scattered in the sample, and the scattered light thereby obtained is detected. In a state in which a substance to be measured is captured by the capture body and a sample is not present on the metal film, a signal indicating the amount of the substance to be measured is detected, the signal being generated by a measurement chip when a second light is radiated to the metal film at a second incidence angle equal to or greater than the critical angle from the prism side. A measurement value indicating the amount of the substance to be measured, the measurement value being determined from the signal, is corrected on the basis of the hematocrit value of the sample determined from the light quantity of the scattered light.

Inventors:

NODA TETSUYA
NAGAI FUMIO
AOKI YOUICHI
OTANI MAKIKO

Application Number:

PCT/JP2017/032132

Publication Date:

March 22, 2018

Filing Date:

September 06, 2017

Export Citation:

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Assignee:

KONICA MINOLTA INC (JP)

International Classes:

G01N21/552; G01N21/49; G01N21/64; G01N33/49; G01N33/543

Domestic Patent References:

WO2016039149A1	2016-03-17
WO2015129615A1	2015-09-03
WO2015194513A1	2015-12-23
WO2014054389A1	2014-04-10

Foreign References:

JP2016004022A	2016-01-12
JP2015059802A	2015-03-30
JP2015059898A	2015-03-30
JP2016507059A	2016-03-07
US20110211189A1	2011-09-01

Other References: