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Patent Searching and Data


Title:
MEASUREMENT SYSTEM BASED ON POINT LASER IMAGING
Document Type and Number:
WIPO Patent Application WO/2017/157043
Kind Code:
A1
Abstract:
A measurement system based on point laser imaging, comprising: a control system; a workbench (110); a fastening assembly (140) for an object to be measured and being provided on the workbench (110); and a guide rail assembly (120) fixed to the workbench (110), wherein the guide rail assembly (120) comprises an upper guide rail (123), and a left guide rail (121) and right guide rail (122) arranged in parallel and spaced apart by a certain distance, the upper guide rail (123) slidably stretches across the left guide rail (121) and the right guide rail (122), and is provided with a measuring assembly (130) slidable in both directions thereon. The guide rail assembly (120) and the measuring assembly (130) are electrically connected to the control system. By reducing the number of steps involving manual assist operation, the system improves the level of automation while ensuring measurement accuracy, thus reducing time consumption of the entire measurement process.

Inventors:
WU JIAFU (CN)
MIAO LEI (CN)
WU XUDONG (CN)
ZHOU PING (CN)
Application Number:
PCT/CN2016/106475
Publication Date:
September 21, 2017
Filing Date:
November 19, 2016
Export Citation:
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Assignee:
SUZHOU RS TECHNOLOGY CO LTD (CN)
International Classes:
G01B11/24
Foreign References:
CN105841630A2016-08-10
CN205607338U2016-09-28
CN201653373U2010-11-24
CN2775603Y2006-04-26
JP2012093238A2012-05-17
CN104422400A2015-03-18
CN102853767A2013-01-02
CN204165513U2015-02-18
JPH11351841A1999-12-24
US20140240459A12014-08-28
Attorney, Agent or Firm:
CHINA FARFIR INTELLECTUAL PROPERTY (CN)
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