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Patent Searching and Data


Title:
MEASUREMENT SYSTEM, MEASUREMENT DEVICE, MEASUREMENT METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/136969
Kind Code:
A1
Abstract:
The present invention accurately and clearly displays a measurement result and a measurement position on an image that includes the measurement position of a physical quantity that is contactlessly measured. This measurement system 100 has: an infrared thermometer 1 having an infrared sensor 11 that contactlessly measures the temperature at a prescribed measurement position, and a light source 13 that irradiates the measurement position with indication light PL; an image acquisition sensor 33 that acquires a measurement position image including the temperature measurement position; a detection unit 41 that detects the position in the measurement position image at which the indication light PL is photographed, thereby detecting the position in the measurement position image that corresponds to the temperature measurement position; and a measurement result image generation unit 42 that generates a measurement result image RI in which a temperature measurement result and an identification display indicating that the position detected by the detection unit 41 is the measurement position of a physical quantity are superposed on the measurement position image.

Inventors:
NAGAOKA EIICHI (JP)
KATSUDA TOSHIHIRO (JP)
Application Number:
PCT/JP2019/030479
Publication Date:
July 02, 2020
Filing Date:
August 02, 2019
Export Citation:
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Assignee:
HORIBA LTD (JP)
International Classes:
G01D7/08; G01J5/48; G06V10/56
Foreign References:
US20170332062A12017-11-16
JP2008164415A2008-07-17
JP2007187611A2007-07-26
JP2010230392A2010-10-14
JP2014132437A2014-07-17
Other References:
See also references of EP 3904838A4
Attorney, Agent or Firm:
WATANABE, Hisashi et al. (JP)
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