Title:
MEASUREMENT SYSTEM AND METHOD, AND COMPONENT REGENERATION SYSTEM AND METHOD
Document Type and Number:
WIPO Patent Application WO/2024/034210
Kind Code:
A1
Abstract:
Provided is a measurement system with which, even when the surface of a component is covered with a coating, it is possible to determine whether or not the coating needs to be removed and to measure the shape of the component. This measurement system is for measuring the shape of a component that has at least a part of the surface thereof covered with a coating, the measurement system comprising: an imaging unit which acquires image data by capturing an image of the component; an image analysis unit which, on the basis of said image data, determines the state of the coating and diagnoses whether or not the coating needs to be removed, and also decides a measurement area; and a measurement unit which measures the shape of the component in the measurement area. When it has been diagnosed that the coating needs to be removed, at least a part of an area obtained by removing the coating is included in the measurement area.
More Like This:
Inventors:
SEKIGUCHI YOSHIFUMI (JP)
MIYAGI MASANORI (JP)
MACHIYA HIDENORI (JP)
TAKAHASHI ERI (JP)
MORI SHUNSUKE (JP)
MIYAGI MASANORI (JP)
MACHIYA HIDENORI (JP)
TAKAHASHI ERI (JP)
MORI SHUNSUKE (JP)
Application Number:
PCT/JP2023/018231
Publication Date:
February 15, 2024
Filing Date:
May 16, 2023
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G01B11/24; G01B21/02; G06Q10/30; G06T7/00
Domestic Patent References:
| WO2022043979A1 | 2022-03-03 | |||
| WO2018185890A1 | 2018-10-11 |
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
Download PDF: