Title:
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2017/175312
Kind Code:
A1
Abstract:
Provided is a measurement system formed by a computing machine, the measurement system characterized in that: the computing machine includes a processor that executes a program, and a storage device that stores the program; the storage device holds shelf shape data, shelf area data showing the area occupied by a shelf, and load area data showing the area on the shelf where a load can be stored; and the processor receives input of warehouse-internal shape data measured by a measurement sensor, matches the shelf shape data and the warehouse-internal shape data, specifies a warehouse-internal position of the shelf, extracts the shelf shape data from the warehouse-internal shape data on the basis of the specified shelf position and the shelf area data, and extracts load area shape data on the shelf from the shelf shape data on the basis of the load area data.
Inventors:
BENIYAMA FUMIKO (JP)
FUJIMOTO KEISUKE (JP)
UEMATSU KENJI (JP)
FUJIMOTO KEISUKE (JP)
UEMATSU KENJI (JP)
Application Number:
PCT/JP2016/061154
Publication Date:
October 12, 2017
Filing Date:
April 05, 2016
Export Citation:
Assignee:
HITACHI TRANSPORT SYSTEM (JP)
International Classes:
B65G1/137; G06Q50/28
Domestic Patent References:
| WO2015059740A1 | 2015-04-30 |
Foreign References:
| JP2010023950A | 2010-02-04 | |||
| JP2004338889A | 2004-12-02 |
Attorney, Agent or Firm:
TOU-OU PATENT FIRM (JP)
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