Title:
MEASUREMENT VALUE ANALYSIS DEVICE AND MEASUREMENT VALUE ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2015/152181
Kind Code:
A1
Abstract:
[Problem] To appropriately calculate, on the basis of correspondence relationships among a plurality of measurement items, a component affecting the measurement values of a measurement item under examination. [Solution] A measurement value analysis device is provided with: a selection unit for selecting a single item under examination to be examined and a plurality of related items that are directly or indirectly related to the item under examination; a correspondence relationship model creation unit for creating, from the past measurement values of the item under examination and the plurality of related items, a model of the correspondence relationships among the measurement values; and a calculation unit for applying the measurement values of the related items to the correspondence relationship model, calculating predicted values for the item under examination, and calculating the discrepancy between the actual measurement values of the item under examination and the predicted values.
Inventors:
FUJII TAKASHI (JP)
Application Number:
PCT/JP2015/060010
Publication Date:
October 08, 2015
Filing Date:
March 30, 2015
Export Citation:
Assignee:
IHI CORP (JP)
DIESEL UNITED LTD (JP)
DIESEL UNITED LTD (JP)
International Classes:
G01D21/00; B63B49/00
Foreign References:
| JP2011220204A | 2011-11-04 |
Other References:
PROVISION, 30 July 2013 (2013-07-30), pages 16 - 21 , 28 to 33, XP008185544
Attorney, Agent or Firm:
OHGA, Shinji et al. (JP)
Heartly congratulation Shinji (JP)
Heartly congratulation Shinji (JP)
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