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Patent Searching and Data


Title:
MEASUREMENT VALUE READING SYSTEM, MEASUREMENT VALUE READING DEVICE, AND MEASUREMENT VALUE READING METHOD
Document Type and Number:
WIPO Patent Application WO/2019/093449
Kind Code:
A1
Abstract:
The present invention is configured such that: at least two markers are arranged around a status display which comprises an analog meter; on the basis of the markers in a photographed image based on a photographing signal obtained by photographing the markers and the status display, an image of the status display in the photographed image is subjected to correction of a three-dimensional inclination thereof, and converted into an image which shows the status display photographed from the right front; and a numerical value indicated by a pointer of the status display is read on the basis of the image of the status display in the photographed image which has been subjected to the correction of the three-dimensional inclination.

Inventors:
NASU, Kiyoshi (1-26, Omika-cho 5-chome, Hitachi-sh, Ibaraki 21, 〒3191221, JP)
OOHASHI, Hidekazu (1-26, Omika-cho 5-chome, Hitachi-sh, Ibaraki 21, 〒3191221, JP)
Application Number:
JP2018/041570
Publication Date:
May 16, 2019
Filing Date:
November 08, 2018
Export Citation:
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Assignee:
HITACHI INDUSTRY & CONTROL SOLUTIONS, LTD. (1-26, Omika-cho 5-chome Hitachi-sh, Ibaraki 21, 〒3191221, JP)
International Classes:
G06T3/00; G06T7/00; H04N5/232
Domestic Patent References:
WO2014203403A12014-12-24
WO2014069248A12014-05-08
Foreign References:
JP2002056387A2002-02-20
JP2014165866A2014-09-08
JP2005010998A2005-01-13
Attorney, Agent or Firm:
SUNNEXT INTERNATIONAL PATENT OFFICE (Seafort Square Center Building, 16F 2-3-12, Higashishinagawa, Shinagawa-k, Tokyo 02, 〒1400002, JP)
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