Title:
MEASURING APPARATUS AND MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2017/126015
Kind Code:
A1
Abstract:
A measuring apparatus (1) is provided with an A/D converter (30), an MUX (40), and a control circuit (50). The A/D converter (30) converts a voltage value (Raa) produced by a thermocouple (10) into a voltage value (Rad) and converts a voltage value (Rba) produced by a cold-junction compensation resistor (20) into a voltage value (Rbd). The MUX (40) is provided with a first input terminal (41) to which the voltage value (Raa) is input and a second input terminal (42) to which the voltage value (Rba) is input. The control circuit (50) processes the voltage value (Rad) and the voltage value (Rbd). The MUX (40) switches between a first state in which the A/D converter (30) converts the voltage value (Raa) into the voltage value (Rad) and a second state in which the A/D converter (30) converts the voltage value (Rba) into the voltage value (Rbd).
Inventors:
SAOTOME JUN (JP)
TANAKA TOMOAKI (JP)
TANAKA TOMOAKI (JP)
Application Number:
PCT/JP2016/051317
Publication Date:
July 27, 2017
Filing Date:
January 18, 2016
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01K7/02; G01K7/24
Foreign References:
JP2009053891A | 2009-03-12 |
Attorney, Agent or Firm:
TAKAMURA, Jun (JP)
Download PDF:
Previous Patent: LAYERED SEMICONDUCTOR DEVICE, AND PRODUCTION METHOD THEREFOR
Next Patent: AIR CONDITIONER INDOOR UNIT
Next Patent: AIR CONDITIONER INDOOR UNIT