Title:
MEASURING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2022/158438
Kind Code:
A1
Abstract:
Provided is a measuring apparatus such that it is possible to realize the occurrence of an abnormality. A measuring apparatus (10) comprises a rectangular measuring platform (12), measuring sensors (42) disposed at four corners of the measuring platform (12), a control unit (38) that calculates a measurement value of a measured object on the measurement platform (12) on the basis of the outputs of the measuring sensors (42), and an abnormality detection means (39) that detects the occurrence of an abnormality on the basis of the output values of the measuring sensors. The occurrence of the abnormality is detected by comparing the sum of the output values of, among the measurement sensors (42), a pair of the measurement sensors (42) that are disposed on one side of the measuring platform (12), with a sum of past output values of said pair of measuring sensors (42).
Inventors:
OTSUKA HIDEKI (JP)
KOWA TSUTOMU (JP)
KOWA TSUTOMU (JP)
Application Number:
PCT/JP2022/001529
Publication Date:
July 28, 2022
Filing Date:
January 18, 2022
Export Citation:
Assignee:
A&D CO LTD (JP)
International Classes:
G01G23/01; G01G19/44
Foreign References:
| JP2015206681A | 2015-11-19 | |||
| JP2000298057A | 2000-10-24 | |||
| CN111351560A | 2020-06-30 | |||
| JP2013253835A | 2013-12-19 |
Attorney, Agent or Firm:
YAGI Hidehito et al. (JP)
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