MEASURING DEPTH OF A SURFACE OF A TEST OBJECT BY MEANS OF A COLOURED FRINGE PATTERN

Title:

MEASURING DEPTH OF A SURFACE OF A TEST OBJECT BY MEANS OF A COLOURED FRINGE PATTERN

Document Type and Number:

WIPO Patent Application WO/2015/155000

Kind Code:

A3

Abstract:

The invention relates to a method for measuring the depth of a surface of a test object. According to said method, a colored fringe pattern formed by a sequence of colored fringes (4) is projected onto a surface of the test object, and a fringe pattern (7) reflected by the surface of the test object is detected and evaluated by means of an evaluation device, the colored fringe pattern and the evaluation device being designed such that the depth of the surface of the test object is measured based on the sequence of colored fringes (4) of the reflected fringe pattern (7) and based on a sequence of fringe (5) widths of the reflected fringe pattern (7).

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Inventors:

SCHICK ANTON (DE)
RENTSCHLER PETER (DE)

Application Number:

PCT/EP2015/056322

Publication Date:

December 03, 2015

Filing Date:

March 25, 2015

Export Citation:

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Assignee:

SIEMENS AG (DE)

International Classes:

G01B11/25

Foreign References:

DE102008002730A1	2009-12-31
US20050200857A1	2005-09-15
US5986745A	1999-11-16

Other References:

FU YUANYUAN, LIU GUOZHONG: "Research on Color Encoding Structured Light 3D Measurement Technology", SPIE, PO BOX 10 BELLINGHAM WA 98227-0010 USA, vol. 6834, no. 683437, 29 November 2007 (2007-11-29), pages 1 - 8, XP040250079, DOI: 10.1117/12.757128

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