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Title:
MEASURING DEVICE, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2018/131634
Kind Code:
A1
Abstract:
This measuring device includes: a measuring unit which measures a reflection characteristic of a surface; an image capturing unit which captures an image of a measurement region of the surface of which the reflection characteristic is being measured by the measuring unit, to obtain an image of the measurement region; and a control unit which causes a display unit to display a plurality of measurement results obtained by means of a plurality of measurements conducted by the measuring unit. The control unit causes the display unit to display the image obtained by the image capturing unit, corresponding to a measurement result selected from among the plurality of measurement results, together with the plurality of measurement results.

More Like This:
WO/2019/021799METHOD FOR MANUFACTURING RESIN PRODUCT AND DEVICE FOR MANUFACTURING RESIN PRODUCT
JPH07229832METHOD AND APPARATUS FOR INSPECTING SURFACE
Inventors:
KAWANAGO HIROSHI (JP)
KUROKI YUKIE (JP)
Application Number:
PCT/JP2018/000431
Publication Date:
July 19, 2018
Filing Date:
January 11, 2018
Export Citation:
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Assignee:
CANON KK (JP)
International Classes:
G01N21/57; G01N21/47
Foreign References:
JPH116795A1999-01-12
JP2014133029A2014-07-24
JP2010131238A2010-06-17
JPH1085222A1998-04-07
JP2004077332A2004-03-11
JP2015029559A2015-02-16
US20140242271A12014-08-28
JP2002508076A2002-03-12
JP2017004612A2017-01-05
Other References:
See also references of EP 3570011A4
Attorney, Agent or Firm:
OHTSUKA, Yasunori et al. (JP)
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