MEASURING DEVICE AND MEASURING METHOD FOR ENERGY HELD BY ELECTRONS

Title:

MEASURING DEVICE AND MEASURING METHOD FOR ENERGY HELD BY ELECTRONS

Document Type and Number:

WIPO Patent Application WO/2017/078111

Kind Code:

A1

Abstract:

According to the present invention, electrons excited by irradiation with visible light 17B in a sample 12b are at an energy level less than vacuum level, are not released as photo-electrons and cannot be energy-measured. Provided is a feature to measure energy from the peak valence band of the excited electrons. The sample 12b is irradiated with visible light 17B through a mesh electrode 22. A surface film that reduces the vacuum level is formed on the surface of the sample 12b. Upon the surface film being formed, photo-electrons are obtained from the visible light and the photo-electrons are accelerated toward a photoelectron spectrometer 19 by the mesh electrode 22. The sample 12b and a metal having the same potential may be irradiated with ultraviolet light. In this case, the mesh electrode 22 is in an evacuated position and interaction between the mesh electrode 22 and the ultraviolet light is prohibited. The difference between the peak valence band and the Fermi level of the sample can be measured.

Inventors:

UJIHARA TORU (JP)
ICHIHASHI FUMIAKI (JP)
KAWAGUCHI TAKAHIKO (JP)
ITO TAKAHIRO (JP)
KUWAHARA MAKOTO (JP)
BALTZER PETER (SE)
TAKEUCHI YUKIO (JP)

Application Number:

PCT/JP2016/082700

Publication Date:

May 11, 2017

Filing Date:

November 02, 2016

Export Citation:

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Assignee:

NAT UNIV CORP NAGOYA UNIV (JP)
VIC INT CO (JP)

International Classes:

G01N23/227; H01J49/48

Domestic Patent References:

WO2014104022A1

2014-07-03

Foreign References:

JPH09318437A	1997-12-12
JPH11162398A	1999-06-18
JPS61264241A	1986-11-22
JPH04343054A	1992-11-30
JPS5145586A	1976-04-19

Other References: