MEASURING DEVICE, MEASURING METHOD AND MEASURING PROGRAM

WIPO Patent Application WO/2017/134828

A1

A measuring device 100 is provided with: a measuring unit 10 which uses sensors 11 and 12 provided on a pipe 99 to cause measuring waves to propagate through a medium 98 flowing through the pipe, and to receive said measuring waves; a trigger detecting unit 21 which detects whether or not a level of the received measuring waves exceeds a pre-determined trigger level; and an identifying unit 22 which identifies a reception timing of the measuring waves on the basis of a waveform part having a period that differs from the period with which the received measuring waves exceed the trigger level. By identifying the reception timing of the measuring waves on the basis of a waveform part having a period that differs from the period with which the received measuring waves exceed the trigger level as detected by the trigger detecting unit, the identifying unit detects the trigger with respect to a peak waveform for which the difference between the peak values of consecutive peak waveforms is largest, on the earlier side of the time axis, such that the trigger is detected with respect to peak waveforms that correspond to one another in forward direction and reverse direction signals, and it is possible to detect a zero-crossing point with respect to a peak waveform having a high SN ratio, on the later side of the time axis, such that the location of the zero-crossing point is detected accurately.

NOGUCHI SHINGO (JP)
KISHIRO MASAMI (JP)

PCT/JP2016/053569

August 10, 2017

February 05, 2016

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FUJI ELECTRIC CO LTD (JP)

G01P5/24; G01F1/66

JP4271979B2	2009-06-03
JP2008014771A	2008-01-24
JP2006003296A	2006-01-05

See also references of EP 3244170A4

RYUKA IP LAW FIRM (JP)

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