Title:
MEASURING DEVICE AND MEASURING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2016/136670
Kind Code:
A1
Abstract:
A measuring device 10 is provided with: a measuring unit 21 having information including programs and parameters for detecting the condition of an object to be measured; a communication unit 13 which acquires, via an external network NW, information including at least a portion of the programs and/or at least a portion of the parameters; and a rewriting unit 23 which rewrites the programs and/or the parameters using the information acquired by the communication unit 13.
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Inventors:
SHIRATA TAKUYA (JP)
IDA YASUHITO (JP)
TOYODA TAKASHI (JP)
IDA YASUHITO (JP)
TOYODA TAKASHI (JP)
Application Number:
PCT/JP2016/055067
Publication Date:
September 01, 2016
Filing Date:
February 22, 2016
Export Citation:
Assignee:
NABTESCO CORP (JP)
International Classes:
G01N21/27; G05B23/02
Domestic Patent References:
| WO2007038533A2 | 2007-04-05 |
Foreign References:
| JP2002228554A | 2002-08-14 | |||
| JP2014002430A | 2014-01-09 | |||
| JP2014191536A | 2014-10-06 | |||
| JP2011008403A | 2011-01-13 | |||
| JP2015010934A | 2015-01-19 | |||
| JP2007257190A | 2007-10-04 | |||
| US20050251276A1 | 2005-11-10 |
Attorney, Agent or Firm:
ONDA, Makoto et al. (JP)
Makoto Onda (JP)
Makoto Onda (JP)
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