MEASURING INSTRUMENT INACCURACY ASSESSMENT SYSTEM AND MEASURING INSTRUMENT INACCURACY ASSESSMENT METHOD

WIPO Patent Application WO/2023/135876

A1

The present invention quantitatively assesses the inaccuracy of measuring instruments installed at a plant. A measuring instrument inaccuracy assessment system (1) comprises a plurality of flowmeters for measuring the water supply flow rate of a plant (3), and has, in a measurement system in which at least one of the flowmeters has a calibration record, a relative bias component calculation unit (13) for calculating a relative bias component from a time average value of measurement values by the flowmeters, a time delay compensation unit (14) for calculating a time delay of the measurement values between the measuring instruments, a water supply fluctuation removal unit (15) for removing a physical time change component of the measurement values, a relative random component calculation unit (16) for calculating a relative random component from a component from which the physical time change of the measurement values is removed, a normality determination unit (17) for determining the normality of the relative random component of the measurement values, and a first output means (181) and a second output means (182) corresponding to the presence and absence of normality of the relative random component of the measurement values.

TAMURA AKINORI (JP)
HAMAURA NORIKAZU (JP)
IKEDA HARUHIKO (JP)
HIDAKA YUKI (JP)

PCT/JP2022/037907

July 20, 2023

October 11, 2022

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HITACHI GE NUCLEAR ENERGY LTD (JP)

G01D21/00; G01F1/00; G01F9/00; G01K1/00; G05D7/00; G21C17/032

WO2014091952A1

2014-06-19

JP2011075373A	2011-04-14
JPS6252601A	1987-03-07

ISONO INTERNATIONAL PATENT OFFICE, P.C. (JP)

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