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Patent Searching and Data


Title:
MEASURING SYSTEM AND ATTACHMENT FOR HOLE DIAMETER MEASUREMENT
Document Type and Number:
WIPO Patent Application WO/2018/139002
Kind Code:
A1
Abstract:
[Problem] To provide a measuring system that has a simple system configuration, can measure a hole diameter accurately in a short time, and can input measurement results in real time without requiring manual operation. [Solution] A measuring system 1 is provided with: a measuring device 10 for generating digital data corresponding to the advance and retreat position of a measuring element 13; and an attachment 20 having a divided cylindrical portion 21 for hole diameter measurement that is divided into a plurality of members in the radial direction and has a diameter that expands or contracts according to the advance or retreat of the measuring element 13. Each divided member of the divided cylindrical portion 21 has, on the inner peripheral side thereof, an inclined inner peripheral surface inclined in the axial direction. The attachment 20 is provided with a mandrel 22 that is connected to the measuring element 13, advances or retreats in response to the advance or retreat of the measuring element 13, and has, on the outer peripheral side thereof, an inclined outer peripheral surface that is in contact with the respective inclined inner peripheral surfaces.

Inventors:
ABE SHINICHI (JP)
SATO SEIKI (JP)
Application Number:
PCT/JP2017/040378
Publication Date:
August 02, 2018
Filing Date:
November 09, 2017
Export Citation:
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Assignee:
KNOWLEDGE MFG COMPANY (JP)
International Classes:
G01B5/12
Foreign References:
JPS6041811U1985-03-25
JP2005030460A2005-02-03
JP2005221320A2005-08-18
JPS5832307U1983-03-02
JP2016164551A2016-09-08
US4866855A1989-09-19
Attorney, Agent or Firm:
OMORI, Junichi (JP)
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