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Patent Searching and Data


Title:
MEASURING SYSTEM AND MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2017/002831
Kind Code:
A1
Abstract:
This measuring system S is provided with: a slit light irradiation device 2 that emits a plurality of slit laser beams 23a to 23d in the shape of a slit to a tubular body 9; a dot light irradiation device 3 that emits a plurality of dot laser beams in the shape of a dot to the tubular body 9, each dot laser beam having a predetermined positional relationship with each of the slit laser beams 23a to 23d; an imaging device 4 that images a plurality of bright lines L1 to L4 that appear on the surface of the tubular body 9 and a plurality of bright spots D that appear on the surface of the tubular body 9 to generate an image thereof; an identification unit 152 that compares the generated image with a reference image representing predetermined positional relationships between the bright lines L1 to L4 and the bright spots D to identify correspondences between the bright lines L1 to L4 in the generated image and the slit laser beams 23a to 23d; and an acquisition unit 153 that acquires three-dimensional coordinates of the bright lines L1 to L4 on the basis of two-dimensional coordinates of the bright lines L1 to L4 in the generated image and the correspondences identified by the identification unit 152.

Inventors:
KAWASUE KIKUHITO (JP)
YOSHIDA KUMIKO (JP)
Application Number:
PCT/JP2016/069197
Publication Date:
January 05, 2017
Filing Date:
June 29, 2016
Export Citation:
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Assignee:
UNIV MIYAZAKI (JP)
International Classes:
G01B11/25
Foreign References:
JP2006528770A2006-12-21
JPH1038531A1998-02-13
JP2012093268A2012-05-17
JP2013088260A2013-05-13
JP2016057194A2016-04-21
Attorney, Agent or Firm:
IZUMI, Michihiro (JP)
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