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Patent Searching and Data


Title:
MEMORY CELL WITH RESISTANCE-SWITCHING LAYERS INCLUDING BREAKDOWN LAYER
Document Type and Number:
WIPO Patent Application WO/2011/159584
Kind Code:
A4
Abstract:
A memory device in a 3-D read and write memory includes memory cells. Each memory cell includes a resistance-switching memory element (RSME) in series with a steering element. The RSME has a resistance-switching layer, a conductive intermediate layer, and first and second electrodes at either end of the RSME. A breakdown layer is electrically between, and in series with, the second electrode and the intermediate layer. The breakdown layer maintains a resistance of at least about 1-10 ΜΩ while in a conductive state. In a set or reset operation of the memory cell, an ionic current flows in the resistance- switching layers, contributing to a switching mechanism. An electron flow, which does not contribute to the switching mechanism, is reduced due to scattering by the conductive intermediate layer, to avoid damage to the steering element. Particular materials and combinations of materials for the different layers of the RSME are provided.

Inventors:
KREUPL FRANZ (US)
FU CHU-CHEN (US)
NIAN YIBO (US)
Application Number:
PCT/US2011/040107
Publication Date:
March 22, 2012
Filing Date:
June 10, 2011
Export Citation:
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Assignee:
SANDISK 3D LLC (US)
KREUPL FRANZ (US)
FU CHU-CHEN (US)
NIAN YIBO (US)
International Classes:
H01L27/24; H01L45/00
Attorney, Agent or Firm:
MAGEN, Burt (LLP575 Market Street, Suite 250, San Francisco CA, US)
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