Title:
MEMORY DIAGNOSTIC DEVICE, MEMORY DIAGNOSTIC METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2012/111135
Kind Code:
A1
Abstract:
A RAM (200) to be diagnosed is divided into n base regions (where n is an integer equal to or greater than 3), two base regions are selected from the divided base regions during an idle time in periodic processing performed in a system in which the RAM (200) in mounted, and the two selected base regions are diagnosed using a diagnostic scheme capable of detecting a coupling fault. Subsequently, an operation is repeated in which a previously unselected pair of base regions is selected and the selected pair is diagnosed in each idle time in the periodic processing, and diagnosis is performed on all pairs.
Inventors:
ICHIOKA RYOYA (JP)
Application Number:
PCT/JP2011/053465
Publication Date:
August 23, 2012
Filing Date:
February 18, 2011
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
ICHIOKA RYOYA (JP)
ICHIOKA RYOYA (JP)
International Classes:
G06F12/16
Foreign References:
| JP2007140920A | 2007-06-07 | |||
| JP2000285033A | 2000-10-13 |
Other References:
NAIR, R ET AL.: "Efficient Algorithms for Testing Semiconductor Random-Access Memories", IEEE TRANSACTIONS ON COMPUTERS, vol. C-27, no. ISS.6, June 1978 (1978-06-01), pages 572 - 576, Retrieved from the Internet [retrieved on 20110413]
Attorney, Agent or Firm:
MIZOI, Shoji et al. (JP)
Shoji Mizoi (JP)
Shoji Mizoi (JP)
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Claims: