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Patent Searching and Data


Title:
METAL DETECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/261818
Kind Code:
A1
Abstract:
In order to provide a metal detection device capable of automatically and accurately determining whether a metal passing through an inspection region is a magnetic metal or a nonmagnetic metal, this metal detection device is provided with: a wave-detection unit (24) that performs quadrature detection of a differential detection signal (Sd) of magnetic field fluctuation in an inspection region (Z) caused by passage of a workpiece (W); and a determination unit (36) that has a first detection unit (36a) which detects, on the basis of both fluctuation components (X, Y) after the wave-detection, the presence/absence of a metal being mixed. The determination unit (36) has: a second determination unit (36b) that determines the phase by comparing sample signal phase data (33) acquired in advance from a detection signal of magnetic field fluctuation in the inspection region (Z) caused by passage of each of metal samples (Tp1, Tp2) among a plurality of metal samples, with signal phase data (θn) acquired from the detection signal (Sd) of magnetic fluctuation in the inspection region (Z) caused by passage of the workpiece (W) having a metal mixed therein; and a third determination unit (36c) that determines the type of the metal passing through the inspection region (Z) on the basis of the phase determination result.

Inventors:
TANIGUCHI EIJI (JP)
NISHIMURA CHIE (JP)
HAYAKAWA YUKI (JP)
Application Number:
PCT/JP2020/019753
Publication Date:
December 30, 2020
Filing Date:
May 19, 2020
Export Citation:
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Assignee:
ANRITSU INFIVIS CO LTD (JP)
International Classes:
G01N27/72; G01V3/10; G01V3/11
Foreign References:
JP2005345433A2005-12-15
JP2010156643A2010-07-15
JPS57192485U1982-12-06
Attorney, Agent or Firm:
ARIGA, Eiichiro et al. (JP)
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