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Patent Searching and Data


Title:
METHOD OF ACQUIRING TISSUE OPTICAL PARAMETERS OVER WIDE FIELD AND PERFORMING LIGHT REFLECTANCE IMAGING OF MICROSTRUCTURE
Document Type and Number:
WIPO Patent Application WO/2017/063236
Kind Code:
A1
Abstract:
A method of acquiring tissue optical parameters over a wide field and performing light reflectance imaging of a microstructure. The method comprises a method of calculating reflectance of a turbid medium applicable at any spatial separation and in the entire spatial frequency domain, and a method of obtaining an optical parameter of the medium by measuring reflectance of the turbid medium at high and low spatial frequencies and then inverting the obtained optical reflectance measurements, wherein the inversion method can be a look-up table method or a formula-fitting method. The measurement of sub-diffusive and diffuse reflectance of turbid media can be used to determine the optical properties of a turbid medium and microstructures such as phase function over a wide field.

Inventors:
XU MIN (US)
Application Number:
PCT/CN2015/093184
Publication Date:
April 20, 2017
Filing Date:
October 29, 2015
Export Citation:
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Assignee:
UNIV WENZHOU MEDICAL (CN)
International Classes:
G01N21/47; A61B5/00; G01N21/55
Foreign References:
CN101856219A2010-10-13
US20040030255A12004-02-12
CN101140222A2008-03-12
CN102144154A2011-08-03
Other References:
REILLY, M. ET AL.: "Analytical Model for Sub-Diffusive Light Reflection and the Application to Spatial Frequency-Domain Imaging", PROC. OF SPIE, vol. 9319, 12 March 2015 (2015-03-12), pages 93191A - 1-93191A-6, XP060048916, ISSN: 1996-756X
XU, LANQING ET AL.: "Discussion on Backscattered Photon Numbers and Their Scattering Events in a Turbid Media", ACTA PHYSICA SINICA, vol. 57, no. 9, 15 September 2008 (2008-09-15), pages 6030 - 6035, XP055375388, ISSN: 1000-3290
Attorney, Agent or Firm:
WENZHOU JINOU PATENT LAW OFFICE (GENERAL PARTNERSHIP) (CN)
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