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Title:
METHOD FOR ANALYZING FINE PARTICLES
Document Type and Number:
WIPO Patent Application WO/2008/007580
Kind Code:
A1
Abstract:
In a method for analyzing fine particles, signal strength in a fine region in a confocal region is measured by scanning the fine region and analyzing the sizes of the fine particles or existence of particle bonding or particle divergence. The volume of one fine region among a plurality of fine regions of which the signal strengths are to be measured is 1FL or less, and a total area of scanning region flat surfaces of the fine regions is 500μm2-40,000μm2.

Inventors:
KOBAYASHI TAMIYO (JP)
KUSANO MASAYOSHI (JP)
FUKUOKA MORINAO (JP)
Application Number:
PCT/JP2007/063297
Publication Date:
January 17, 2008
Filing Date:
July 03, 2007
Export Citation:
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Assignee:
OLYMPUS CORP (JP)
KOBAYASHI TAMIYO (JP)
KUSANO MASAYOSHI (JP)
FUKUOKA MORINAO (JP)
International Classes:
G01N15/14; G01N21/64; G02B21/06
Domestic Patent References:
WO2002048693A12002-06-20
Other References:
NAKABAYASHI T.: "Keiko Jumyo Imaging System no Sakusei to Seitai Shiryo Oyobi Kobunshi Shiryo eno Oyo (Construction of a Fluorescence Lifetime Imaging System and its Application to Biological Systems and Polymer Materials)", JOURNAL OF THE SPECTROSCOPICAL SOCIETY OF JAPAN, vol. 55, no. 1, 15 February 2006 (2006-02-15), pages 31 - 39, XP003020459
KANESHIRO M.: "Keiko Kenkibyo", PROTEIN, NUCLEIC ACID AND ENZYME, BIO KOSEINO KIKI . SHIN GIJUTSU RIYO MANUAL, vol. 49, no. 11, 10 August 2004 (2004-08-10), pages 1576 - 1583, XP003020460
Attorney, Agent or Firm:
TANAI, Sumio et al. (YaesuChuo-ku, Tokyo, JP)
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