Title:
METHOD FOR ANALYZING POLYMER LAYER
Document Type and Number:
WIPO Patent Application WO/2019/013603
Kind Code:
A1
Abstract:
The present application relates to a method for analyzing a polymer layer, the method being able to effectively eliminate noise so as to increase the accuracy of analysis of the structure of a polymer layer, and shorten the analysis time.
Inventors:
RYU HYUNG JU (KR)
KU SE JIN (KR)
LEE MI SOOK (KR)
YOON SUNG SOO (KR)
KU SE JIN (KR)
LEE MI SOOK (KR)
YOON SUNG SOO (KR)
Application Number:
PCT/KR2018/008019
Publication Date:
January 17, 2019
Filing Date:
July 16, 2018
Export Citation:
Assignee:
LG CHEMICAL LTD (KR)
International Classes:
G06T7/00; G01N21/17; G01N33/44; G01Q30/02; G06T5/00; G06T5/50; G06V10/30
Foreign References:
| US20070172150A1 | 2007-07-26 | |||
| KR100784599B1 | 2007-12-11 | |||
| KR20170055709A | 2017-05-22 | |||
| KR20090073470A | 2009-07-03 | |||
| KR20170089864A | 2017-08-04 |
Other References:
LEE, JUNYOUNG ET AL.: "Microstmctures of Triblock Copolymers", POLYMER SCIENCE AND TECHNOLOGY, vol. 23, no. 5, 31 October 2012 (2012-10-31), pages 525 - 540, XP009518501, ISSN: 1225-0260
See also references of EP 3637366A4
See also references of EP 3637366A4
Attorney, Agent or Firm:
DANA PATENT LAW FIRM (KR)
Download PDF:
Previous Patent: NEUTRAL LAYER COMPOSITION
Next Patent: LIQUID CRYSTAL PANEL AND METHOD FOR MANUFACTURING SAME
Next Patent: LIQUID CRYSTAL PANEL AND METHOD FOR MANUFACTURING SAME