METHOD FOR ANOMALY DETECTION/DIAGNOSIS, SYSTEM FOR ANOMALY DETECTION/DIAGNOSIS, AND PROGRAM FOR ANOMALY DETECTION/DIAGNOSIS

Title:

METHOD FOR ANOMALY DETECTION/DIAGNOSIS, SYSTEM FOR ANOMALY DETECTION/DIAGNOSIS, AND PROGRAM FOR ANOMALY DETECTION/DIAGNOSIS

Document Type and Number:

WIPO Patent Application WO/2011/132524

Kind Code:

A1

Abstract:

In order to provide a method and system for anomaly detection/diagnosis that can detect anomalies quickly and with high sensitivity in a installation such as a plant, in the present disclosures, sets of maintenance record information comprising operational records, replacement part information and other past cases are associated with each other on a keyword basis, anomalies are detected on the basis of anomaly detection that targets the output signal of a multidimensional sensor attached to the installation, and by means of connecting the detected anomaly with the associated maintenance record information, the required diagnosis/measures with respect to the anomaly that has arisen are elucidated.

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Inventors:

MAEDA Shunji (HITACHI LTD., 292, Yoshida-cho, Totsuka-ku, Yokohama-sh, Kanagawa 17, 〒2440817, JP)
前田　俊二 (〒17 神奈川県横浜市戸塚区吉田町２９２番地　株式会社日立製作所　横浜研究所内 Kanagawa, 〒2440817, JP)
SHIBUYA Hisae (HITACHI LTD., 292, Yoshida-cho, Totsuka-ku, Yokohama-sh, Kanagawa 17, 〒2440817, JP)

Application Number:

JP2011/058582

Publication Date:

October 27, 2011

Filing Date:

April 05, 2011

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Assignee:

HITACHI, LTD. (6-6 Marunouchi 1-chome, Chiyoda-ku Tokyo, 80, 〒1008280, JP)
株式会社日立製作所 (〒80 東京都千代田区丸の内一丁目６番６号 Tokyo, 〒1008280, JP)
MAEDA Shunji (HITACHI LTD., 292, Yoshida-cho, Totsuka-ku, Yokohama-sh, Kanagawa 17, 〒2440817, JP)
前田　俊二 (〒17 神奈川県横浜市戸塚区吉田町２９２番地　株式会社日立製作所　横浜研究所内 Kanagawa, 〒2440817, JP)

International Classes:

G05B23/02; G06Q50/00; G21C17/00

Attorney, Agent or Firm:

POLAIRE I.P.C. (7-1 Hatchobori 2-chome, Chuo-ku Tokyo, 32, 〒1040032, JP)

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Claims:

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