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Title:
METHOD FOR ANOMALY DETECTION/DIAGNOSIS, SYSTEM FOR ANOMALY DETECTION/DIAGNOSIS, AND PROGRAM FOR ANOMALY DETECTION/DIAGNOSIS
Document Type and Number:
WIPO Patent Application WO/2011/132524
Kind Code:
A1
Abstract:
In order to provide a method and system for anomaly detection/diagnosis that can detect anomalies quickly and with high sensitivity in a installation such as a plant, in the present disclosures, sets of maintenance record information comprising operational records, replacement part information and other past cases are associated with each other on a keyword basis, anomalies are detected on the basis of anomaly detection that targets the output signal of a multidimensional sensor attached to the installation, and by means of connecting the detected anomaly with the associated maintenance record information, the required diagnosis/measures with respect to the anomaly that has arisen are elucidated.

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Inventors:
MAEDA SHUNJI (JP)
SHIBUYA HISAE (JP)
MAGARA HIROYUKI (JP)
Application Number:
PCT/JP2011/058582
Publication Date:
October 27, 2011
Filing Date:
April 05, 2011
Export Citation:
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Assignee:
HITACHI LTD (JP)
MAEDA SHUNJI (JP)
SHIBUYA HISAE (JP)
MAGARA HIROYUKI (JP)
International Classes:
G05B23/02; F01D25/00; F02C7/00; F02C9/00; G01M99/00; G06Q50/00; G06Q50/10; G21C17/00
Foreign References:
JPH0721024A1995-01-24
JPH05256741A1993-10-05
JP2000259223A2000-09-22
Attorney, Agent or Firm:
POLAIRE I. P. C. (JP)
Polaire Intellectual Property Corporation (JP)
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