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Title:
METHOD AND APPARATUS FOR CLASSIFYING A BRAIN ANOMALY BASED ON A 3D MRI IMAGE
Document Type and Number:
WIPO Patent Application WO/2020/034469
Kind Code:
A1
Abstract:
A method and an apparatus for classifying a brain anomaly based on a 3D MRI image, wherein the classifying method comprises: receiving a to-be-processed 3D MRI image, performing a convolution operation on an imaging sequence corresponding to the 3D MRI image based on a first neural network algorithm to obtain feature maps and segmentation mask; and performing a classification operation on the imaging sequence corresponding to the 3D MRI image based on a second neural network algorithm and the feature maps and segmentation mask to obtain a classification result of the brain anomaly. Supported by the technologies of artificial intelligence and big data processing, the method enable classification of a brain anomaly shown in the received MRI image through training an MRI recognition model, thereby effectively improving classification accuracy of the brain anomaly and further enhancing diagnosis accuracy of the brain anomaly based on the MRI image.

Inventors:
LOUIS LEE PERSHUNG (MY)
CHAN WEI SHENG (MY)
JI JIAHAO (CN)
Application Number:
PCT/CN2018/115535
Publication Date:
February 20, 2020
Filing Date:
November 15, 2018
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Assignee:
BEIJING ANDE YIZHI TECH CO LTD (CN)
International Classes:
G06T7/00; G06V10/764
Domestic Patent References:
WO2017091833A12017-06-01
Foreign References:
CN107016681A2017-08-04
CN107492099A2017-12-19
CN107067395A2017-08-18
CN107220980A2017-09-29
Attorney, Agent or Firm:
GLOBE-LAW LAW FIRM (CN)
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