Title:
METHOD AND APPARATUS FOR CREATING AND TESTING A CHANNEL DECODER WITH BUILT-IN SELF-TEST (BIST)
Document Type and Number:
WIPO Patent Application WO2002047298
Kind Code:
A3
Abstract:
The invention provides a method and apparatus for creating and testing a channel decoder with built-in self-test (100). The method and apparatus consist of simulating any specified channel decoder architecture and operation. The simulated channel decoder is then modified for built-in self-test (BIST). A production test signal is created as a product of the modified channel decoder simulation. A channel decoder patterned after the modified channel decoder simulation is manufactured. The manufactured channel decoder is then tested using the production test signal and BIST.
Inventors:
VEILLETTE BENOIT R
Application Number:
PCT/EP2001/013813
Publication Date:
January 08, 2004
Filing Date:
November 26, 2001
Export Citation:
Assignee:
KONINKL PHILIPS ELECTRONICS NV (NL)
International Classes:
H04B17/00; H04L69/40; G01R31/28; (IPC1-7): G01R31/3167; G01R31/3187; H04B17/00
Foreign References:
| US6118811A | 2000-09-12 |
Other References:
DUFORT B ET AL: "SIGNAL GENERATION USING PERIODIC SINGLE AND MULTI-BIT SIGMA-DELTA MODULATED STREAMS", PROCEEDINGS OF THE INTERNATIONAL TEST CONFERENCE. ITC '97. WASHINGTON, DC, NOV. 1 - 6, 1997, INTERNATIONAL TEST CONFERENCE, NEW YORK, NY: IEEE, US, vol. CONF. 28, 1 November 1997 (1997-11-01), pages 396 - 405, XP000800336, ISBN: 0-7803-4210-0
ROBERTS G W ET AL: "MAKING COMPLEX MIXED-SIGNAL TELECOMMUNICATION INTEGRATED CIRCUITS TESTABLE", IEEE COMMUNICATIONS MAGAZINE, IEEE SERVICE CENTER. PISCATAWAY, N.J, US, vol. 37, no. 6, June 1999 (1999-06-01), pages 90 - 96, XP000835284, ISSN: 0163-6804
PICHON F: "Testability features for a submicron voice-coder ASIC", PROCEEDINGS. INTERNATIONAL TEST CONFERENCE 1996. TEST AND DESIGN VALIDITY (IEEE CAT. NO.96CH35976), PROCEEDINGS INTERNATIONAL TEST CONFERENCE 1996. TEST AND DESIGN VALIDITY, WASHINGTON, DC, USA, 20-25 OCT. 1996, 1996, Altoona, PA, USA, Int. Test Conference, USA, pages 377 - 385, XP002228502, ISBN: 0-7803-3541-4
PAPACHRISTOU C A ET AL: "Microprocessor based testing for core-based system on chip", DESIGN AUTOMATION CONFERENCE, 1999. PROCEEDINGS. 36TH NEW ORLEANS, LA, USA 21-25 JUNE 1999, PISCATAWAY, NJ, USA,IEEE, US, 21 June 1999 (1999-06-21), pages 586 - 591, XP010344097, ISBN: 1-58113-092-9
ROBERTS G W ET AL: "MAKING COMPLEX MIXED-SIGNAL TELECOMMUNICATION INTEGRATED CIRCUITS TESTABLE", IEEE COMMUNICATIONS MAGAZINE, IEEE SERVICE CENTER. PISCATAWAY, N.J, US, vol. 37, no. 6, June 1999 (1999-06-01), pages 90 - 96, XP000835284, ISSN: 0163-6804
PICHON F: "Testability features for a submicron voice-coder ASIC", PROCEEDINGS. INTERNATIONAL TEST CONFERENCE 1996. TEST AND DESIGN VALIDITY (IEEE CAT. NO.96CH35976), PROCEEDINGS INTERNATIONAL TEST CONFERENCE 1996. TEST AND DESIGN VALIDITY, WASHINGTON, DC, USA, 20-25 OCT. 1996, 1996, Altoona, PA, USA, Int. Test Conference, USA, pages 377 - 385, XP002228502, ISBN: 0-7803-3541-4
PAPACHRISTOU C A ET AL: "Microprocessor based testing for core-based system on chip", DESIGN AUTOMATION CONFERENCE, 1999. PROCEEDINGS. 36TH NEW ORLEANS, LA, USA 21-25 JUNE 1999, PISCATAWAY, NJ, USA,IEEE, US, 21 June 1999 (1999-06-21), pages 586 - 591, XP010344097, ISBN: 1-58113-092-9
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