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Patent Searching and Data


Title:
METHOD AND APPARATUS FOR ESTIMATING WEIGHT OF INSPECTED OBJECT IN SAFETY INSPECTION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2017/012562
Kind Code:
A1
Abstract:
A method for estimating the weight of an inspected object in a safety inspection system comprises: scanning by means of dual-energy rays to obtain an equivalent atomic number value and a dual-energy high-energy gray feature value corresponding to each pixel point of an inspected object (S510); obtaining a mass thickness value of a corresponding pixel from a pre-created mass thickness attenuation curve by means of the equivalent atomic number and dual-energy high-energy gray feature value of each pixel (S520); and multiplying the area of the pixel by the mass thickness value to obtain at least part of weight information about the inspected object. The method can more accurately calculate the weight of an inspected object, thereby reducing the cost of conventional weighting hardware. Also disclosed is an apparatus for estimating the weight of an inspected object in a safety inspection system.

Inventors:
CHEN ZHIQIANG (CN)
LI YUANJING (CN)
ZHANG LI (CN)
ZHAO ZIRAN (CN)
LIU YAOHONG (CN)
ZHENG JUAN (CN)
GU JIANPING (CN)
ZONG CHUNGUANG (CN)
Application Number:
PCT/CN2016/090828
Publication Date:
January 26, 2017
Filing Date:
July 21, 2016
Export Citation:
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Assignee:
UNIV TSINGHUA (CN)
NUCTECH CO LTD (CN)
International Classes:
G01N23/04; G01V5/00
Foreign References:
CN104048977A2014-09-17
CN1749742A2006-03-22
CN101266216A2008-09-17
CN101629916A2010-01-20
CN101647706A2010-02-17
US20100046703A12010-02-25
Other References:
See also references of EP 3327430A4
Attorney, Agent or Firm:
CHINA SCIENCE PATENT & TRADEMARK AGENT LTD. (CN)
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