Title:
METHOD AND APPARATUS FOR MEASURING ARRIVAL TIME OF HIGH-ENERGY PHOTONS
Document Type and Number:
WIPO Patent Application WO/2018/090900
Kind Code:
A1
Abstract:
A method and apparatus for measuring an arrival time of high-energy photons. The method comprises: acquiring an arrival time associated with visible photons which are detected by each sensor unit in a photosensor array (120) and which are generated by means of a reaction between high-energy photons and scintillation crystals, wherein the scintillation crystals is continuous crystals (110), and the photosensor array (120) comprises a plurality of sensor units coupled to the scintillation crystals (S210, S310, S410); acquiring an average waiting time corresponding to each of at least part of sensor units selected from among the photosensor array (120), respectively, at least on the basis of the arrival time associated with the visible photons detected by each sensor unit in the photosensor array (120) (S220); and, calculating a mean value on the average waiting time respectively corresponding to each of the at least part of the sensor units, so as to obtain an arrival time of the high-energy photons (S230, S350, S470). According to the method and apparatus, by calculating a mean value of the average waiting time acquired by a plurality of sensor units, a higher temporal resolution may be obtained.
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Inventors:
GONG ZHENG (CN)
ZHAO ZHIXIANG (CN)
XU JIANFENG (CN)
WENG FENGHUA (CN)
HUANG QIU (CN)
ZHAO ZHIXIANG (CN)
XU JIANFENG (CN)
WENG FENGHUA (CN)
HUANG QIU (CN)
Application Number:
PCT/CN2017/110864
Publication Date:
May 24, 2018
Filing Date:
November 14, 2017
Export Citation:
Assignee:
ZHONGPAI S&T SHENZHEN CO LTD (CN)
International Classes:
G01T1/00
Foreign References:
| CN106443747A | 2017-02-22 | |||
| CN105093258A | 2015-11-25 | |||
| CN104656115A | 2015-05-27 | |||
| CN105769229A | 2016-07-20 | |||
| CN101772714A | 2010-07-07 | |||
| US6628984B2 | 2003-09-30 |
Attorney, Agent or Firm:
RUIBANG & PARTNERS (CN)
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