Title:
METHOD AND APPARATUS FOR MEASURING IMPEDANCE OF ELECTRICAL COMPONENT UNDER HIGH INTERFERENCE CONDITIONS
Document Type and Number:
WIPO Patent Application WO2005022171
Kind Code:
A3
Abstract:
A test system and method having a test channel and an additional channel (212), and wherein the ratio of amplitude and phase between the interference current through the device under test (208) and the interference signal on the additional channel (212) are determined. The system further applies a voltage (202) at or near line frequency to the device under test (208), and then continuously subtracts the additional interference signal from the current signal through the device under test. In doing so, the system and method allows accurate measurements of the real and reactive power of an impedance at or very close to the line frequency.
Inventors:
GRUN THOMAS (CH)
Application Number:
PCT/US2004/026801
Publication Date:
January 05, 2006
Filing Date:
August 18, 2004
Export Citation:
Assignee:
HUBBELL INC (US)
GRUN THOMAS (CH)
GRUN THOMAS (CH)
International Classes:
G01R21/00; G01R27/00; G01R27/16; G01R31/12; H04B1/06; H04B7/00; G01R; (IPC1-7): G01R25/00
Foreign References:
| US4384366A | 1983-05-17 | |||
| US5475709A | 1995-12-12 | |||
| US6114983A | 2000-09-05 | |||
| US6812716B2 | 2004-11-02 |
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