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Patent Searching and Data


Title:
METHOD AND APPARATUS FOR MEASURING THIRD RAIL
Document Type and Number:
WIPO Patent Application WO/2018/164213
Kind Code:
A1
Abstract:
The present invention is provided with: a laser measurement region sensor (10) capable of allowing a lower surface contact-type third rail (5) and a traveling rail (8) to be simultaneously in a measurement range; and a data processing unit (40) for calculating the position of the third rail (5) with respect to the traveling rail (8) on the basis of positional data obtained by the laser measurement region sensor (10), whereby the third rail (5) can be measured. In addition, by not only measuring the third rail (5) but also measuring the traveling rail (8) by means of the laser measurement region sensor (10), the present invention exhibits an effect in which the position of the third rail (5) with respect to the traveling rail (8) can be calculated.

Inventors:
WATABE, Yusuke (1-1 Osaki 2-chome, Shinagawa-k, Tokyo 29, 〒1416029, JP)
FUKAI, Hironobu (1-1 Osaki 2-chome, Shinagawa-k, Tokyo 29, 〒1416029, JP)
Application Number:
JP2018/008918
Publication Date:
September 13, 2018
Filing Date:
March 08, 2018
Export Citation:
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Assignee:
MEIDENSHA CORPORATION (1-1 Osaki 2-chome, Shinagawa-ku Tokyo, 29, 〒1416029, JP)
International Classes:
G01B11/00; B60M1/30; B61K9/08
Foreign References:
JPH0682221A1994-03-22
CN103863357A2014-06-18
JPH0656711U1994-08-05
JP2009019923A2009-01-29
JP2012192759A2012-10-11
JPS61201108A1986-09-05
JPH05141947A1993-06-08
Attorney, Agent or Firm:
MITSUISHI, Toshiro et al. (Mitsuishi Law and Patent Office, 4th Floor TAKU-Akasaka Building, 9-6, Akasaka 4-chome, Minato-k, Tokyo 52, 〒1070052, JP)
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