Title:
METHOD FOR ASSIGNING A PULSE RESPONSE TO ONE OF A PLURALITY OF PULSE TYPES WITH DIFFERENT DECAY TIMES AND DEVICE FOR CARRYING OUT SAID METHOD
Document Type and Number:
WIPO Patent Application WO2003060557
Kind Code:
A3
Abstract:
A method for assigning a pulse profile, in particular a pulse profile of a scintillation detector having at least two scintillation materials with different decay characteristics, to one of a plurality of pulse types with differing decay times, encompasses the method steps of: acquiring an output pulse profile and converting the pulse profile into an electrical signal whose amplitude-time profile represents the pulse profile of the output pulse; transforming the amplitude-time profile into the frequency space in order to obtain an amplitude-frequency profile representing the output pulse; normalizing the amplitude-frequency profile in order to obtain a normalized amplitude-frequency profile; comparing the normalized amplitude-frequency profile with a predetermined reference profile; and assigning the output pulse profile to one of the pulse types on the basis of the result of the comparison.
Inventors:
SALEH HASSAN (EG)
ZIMMERMANN EGON (DE)
HALLING HORST (DE)
ZIMMERMANN EGON (DE)
HALLING HORST (DE)
Application Number:
PCT/EP2002/014710
Publication Date:
November 04, 2004
Filing Date:
December 23, 2002
Export Citation:
Assignee:
FORSCHUNGSZENTRUM JUELICH GMBH (DE)
SALEH HASSAN (EG)
ZIMMERMANN EGON (DE)
HALLING HORST (DE)
SALEH HASSAN (EG)
ZIMMERMANN EGON (DE)
HALLING HORST (DE)
International Classes:
G01R23/16; G01T1/00; G01T1/164; G01T1/17; G01T1/20; H03K5/22; (IPC1-7): G01T1/17; H03K5/22; G01R23/16
Foreign References:
| US5347129A | 1994-09-13 | |||
| DE19835671A1 | 1999-02-11 | |||
| US6194728B1 | 2001-02-27 | |||
| US4870667A | 1989-09-26 | |||
| US5866907A | 1999-02-02 |
Other References:
SCHMAND W ET AL: "ADVANTAGES USING PULSE SHAPE DISCRIMINATION TO ASSIGN THE DEPTH DETECTOR. OF INTERACTION INFORMATION (DOI) FROM A MULTI LAYER PHOSWICH", IEEE TRANSACTIONS ON NUCLEAR SCIENCE, IEEE INC. NEW YORK, US, vol. 46, no. 4, PART 2, August 1999 (1999-08-01), pages 985 - 990, XP000873887, ISSN: 0018-9499
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