METHOD FOR AUTOMATED ANALYSIS, AUTOMATED ANALYZER, AND PROGRAM FOR AUTOMATED ANALYZERS

Title:

METHOD FOR AUTOMATED ANALYSIS, AUTOMATED ANALYZER, AND PROGRAM FOR AUTOMATED ANALYZERS

Document Type and Number:

WIPO Patent Application WO/2014/038234

Kind Code:

A1

Abstract:

Provided are a method for automated analysis, an automated analyzer, and a program for automated analyzers capable of determining more accurately and simply the number of components contained in a sample. Components are identified on the basis of resolved spectral data obtained with multivariate curve resolution (MCR) using a provisional number of components (k), and the number of components contained in the sample is determined on the basis of those determination results. At this time, multivariate curve resolution is repeated (Steps S103 to S108) until a boundary value is obtained between the provisional number of components (k) when different components are identified in all sets of resolved spectral data obtained from multivariate curve resolution and the provisional number of components (k) when the same component is identified in at least two sets of resolved spectral data of the resolved spectral data obtained with multivariate curve resolution. By virtue of this, the number of components contained in the sample can be determined more accurately and simply on the basis of the obtained boundary value (Step S113).

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Inventors:

MISHIMA KENICHI (JP)

Application Number:

PCT/JP2013/060099

Publication Date:

March 13, 2014

Filing Date:

April 02, 2013

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Assignee:

SHIMADZU CORP (JP)

International Classes:

G01N21/00; G01N21/35; G01N35/00

Foreign References:

JP2011257288A	2011-12-22
JP2011257288A	2011-12-22
JP2009540322A	2009-11-19

Other References:

SHUNSUKE MUTO: "Mapping of Physical Properties in Nanometer-scale by Multivariate Spectrum Analysis", MATERIA JAPAN, vol. 51, no. 9, 1 September 2012 (2012-09-01), pages 416 - 423, XP055189002

Attorney, Agent or Firm:

YOSHIMOTO, Tsutomu et al. (JP)
Tsuyoshi Yoshimoto (JP)

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